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Measuring charge trap occupation and energy level in CdSe/ZnS quantum dots using a scanning tunneling microscope

✍ Scribed by Hummon, M. R.; Stollenwerk, A. J.; Narayanamurti, V.

Book ID: 115534843
Publisher: The American Physical Society
Year: 2010
Tongue: English
Weight: 732 KB
Volume: 81
Category: Article
ISSN: 1098-0121
DOI: 10.1103/physrevb.81.115439

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