Measuring and modeling minority carrier transport in heavily doped silicon : J. Del Alamo, S. Swirhun and R. M. Swanson. Solid-St. Electron.28 (1/2) 47 (1985)

• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 253 KB
• Volume: 26
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(86)90180-0