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Measurements of Ultrafast Optical Nonlinearities in Semiconductors

✍ Scribed by B. D. Fluegel; J. P. Sokoloff; F. Jarka; S. W. Koch; M. Lindberg; N. Peyghambarian; M. Joffre; D. Hulin; A. Migus; A. Antonetti; C. Ell; L. Banyai; H. Haug


Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
499 KB
Volume
150
Category
Article
ISSN
0370-1972

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