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Measurements of transport properties of Ag/Al and Ag/Cu multilayered films

โœ Scribed by W.-H. Soe; T. Kaizuka; R. Yamamoto; T. Matsuhashi


Book ID
118407002
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
209 KB
Volume
126
Category
Article
ISSN
0304-8853

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AbstractรFree standing polycrystalline thin ยฎlms with a strong h111i texture were tested in uniaxial tension. Studied were electron-beam deposited Ag, Cu and Al ยฎlms, and Ag/Cu multilayers consisting of alternating Ag and Cu layers of equal thickness, between 1.5 nm and 1.5 mm (bilayer repeat length