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Measurements of thermal diffusivity of boron-silicon film-on-glass structure using phase detection method of photothermal deflection spectroscopy

✍ Scribed by B. X. Shi; C. W. Ong; K. L. Tam

Book ID
111536639
Publisher
Springer
Year
1999
Tongue
English
Weight
117 KB
Volume
34
Category
Article
ISSN
0022-2461

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