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Measurements of the thickness distribution of thin films with a slit-beam-profile reflectometer

✍ Scribed by Qing, De-Kui; Yamaguchi, Ichirou; Okamoto, Takayuki; Yamamoto, Mari


Book ID
115424192
Publisher
Optical Society of America
Year
2000
Tongue
English
Weight
263 KB
Volume
25
Category
Article
ISSN
0146-9592

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