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Measurements of the rotational relaxation times for absorption lines with Voigt profiles

✍ Scribed by V. L. Vaks; S. D. Nikiforov; E. A. Sobakinskaya; A. G. Zhogov


Book ID
110175014
Publisher
SP MAIK Nauka/Interperiodica
Year
2006
Tongue
English
Weight
220 KB
Volume
100
Category
Article
ISSN
0030-400X

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The self-and foreign (Ar, N 2 , and O 2 )-pressure effects on the submillimeter-wave absorption line profiles have been investigated for the J ΒΌ 26-25 and 25-24 rotational transitions of N 2 O using the AIST terahertz spectrometer. By fitting the observed absorption profiles with the Galatry functio