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Measurements of the half-life of 214Po and 218Rn using digital electronics

✍ Scribed by G. Suliman; S. Pommé; M. Marouli; R. Van Ammel; V. Jobbágy; J. Paepen; H. Stroh; C. Apostolidis; K. Abbas; A. Morgenstern

No coin nor oath required. For personal study only.

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