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Measurements of the electric field distribution on semiconductor surfaces using the electron mirror microscope (E. M. M.)

✍ Scribed by Warmiński, T. ;Glass, I.

Publisher: John Wiley and Sons
Year: 1971
Tongue: English
Weight: 330 KB
Volume: 8
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210080140

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