Measurements of small-signal photo-EMF of Si and Ge MIS structures using scanning light probe

✍ Scribed by Nakhmanson, R. S. ;Popov, L. K.

• Publisher: John Wiley and Sons
• Year: 1978
• Tongue: English
• Weight: 590 KB
• Volume: 46
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210460106