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Measurements of residual stress in semi-insulating GaAs by Cr-related luminescence lines

✍ Scribed by Y. Fujiwara; T. Nishino; Y. Hamakawa

Publisher: Springer
Year: 1986
Tongue: English
Weight: 701 KB
Volume: 41
Category: Article
ISSN: 1432-0630
DOI: 10.1007/bf00631118

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