Measurements of relative x-ray line intensities and their application to a single standard procedure for quantitative x-ray microanalysis

✍ Scribed by Hatzistergos, M. S.; Lifshin, E.

• Book ID: 118054460
• Publisher: American Institute of Physics
• Year: 2006
• Tongue: English
• Weight: 656 KB
• Volume: 100
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.2400089