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Measurements of Permittivity, Dielectric Loss Tangent, and Resistivity of Float-Zone Silicon at Microwave Frequencies

โœ Scribed by Krupka, J.; Breeze, J.; Centeno, A.; Alford, N.; Claussen, T.; Jensen, L.


Book ID
111879970
Publisher
IEEE
Year
2006
Tongue
English
Weight
799 KB
Volume
54
Category
Article
ISSN
0018-9480

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