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Measurements of parametric X-rays from relativistic electrons in silicon crystals

โœ Scribed by Yu.N. Adishchev; A.N. Didenko; V.V. Mun; G.A. Pleshkov; A.P. Potylitsin; V.K. Tomchakov; S.R. Uglov; S.A. Vorobiev


Book ID
113278101
Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
516 KB
Volume
21
Category
Article
ISSN
0168-583X

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