✦ LIBER ✦
Measurement of three dimensional stress and modeling of stress induced migration failure in aluminum interconnects : Atsumu Texaki, Takashi Meneta, Hidemitsu Egawa and Tatsuo Noguchi. 28th A. Proc. Reliab. Phys. Symp. (IEEE), 221 (March 1990)
- Book ID
- 103283020
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 131 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0026-2714
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