𝔖 Bobbio Scriptorium

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Measurement of thin film thickness by a flotation method: G A Andreev et al, Zavodsk Lab, 36 (12), 1970, 1486–1487 (in Russian).

Publisher: Elsevier Science
Year: 1971
Tongue: English
Weight: 145 KB
Volume: 21
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(71)91714-3

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