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Measurement of the tip-sample capacitance for Si surfaces

โœ Scribed by Shu Kurokawa; M. Yuasa; Y. Hasegawa; A. Sakai


Book ID
116068290
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
311 KB
Volume
357-358
Category
Article
ISSN
0039-6028

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