Measurement of the threshold voltage in MOS capacitors by the equilibrium controlled static C-V method

✍ Scribed by M. Kerber; C. Mazuré; U. Schwalke

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 468 KB
• Volume: 35
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(92)90241-4