Measurement of the thickness of thin films by optical means, from Rayleigh and Drude to Langmuir, and the development of the present ellipsometer: A Rothen,Misc Publ Nat Bur Stand, 256, 1964, 7–21

• Publisher: Elsevier Science
• Year: 1965
• Tongue: English
• Weight: 114 KB
• Volume: 15
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(65)91754-9