Measurement of the thermal properties of thin dielectric films by a probe technique with periodic heating. I. Theory underlying the method

✍ Scribed by S. N. Kravchun; S. T. Davitadze; N. S. Mizina; B. A. Strukov

• Book ID: 110118012
• Publisher: SP MAIK Nauka/Interperiodica
• Year: 1997
• Tongue: English
• Weight: 166 KB
• Volume: 39
• Category: Article
• ISSN: 1063-7834
• DOI: 10.1134/1.1129912