Measurement of the thermal emf of semiconductor materials during a change in heat emission conditions

✍ Scribed by K. K. Semenyuk

• Publisher: Springer US
• Year: 1979
• Tongue: English
• Weight: 107 KB
• Volume: 22
• Category: Article
• ISSN: 0543-1972
• DOI: 10.1007/bf00836935