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Measurement of the resistance of metal-semiconductor-metal structures using the geometrical magnetoresistance technique

✍ Scribed by Andrzej Wolkenberg; Tomasz Przesławski; Jerzy Klamka


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
303 KB
Volume
35
Category
Article
ISSN
0038-1101

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