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Measurement of the parameters of infralow-frequency voltages in the verification of profilometers and profilographs

✍ Scribed by M. T. Ryspaev

Publisher: Springer US
Year: 1984
Tongue: English
Weight: 130 KB
Volume: 27
Category: Article
ISSN: 0543-1972
DOI: 10.1007/bf00862304

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