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Measurement of the local latch-up sensitivity by means of computer-controller scanning electron microscopy

✍ Scribed by Canali, C.; Giannini, M.; Scorzoni, A.; Vanzi, M.; Zanoni, E.

Book ID: 119773462
Publisher: IEEE
Year: 1988
Tongue: English
Weight: 874 KB
Volume: 23
Category: Article
ISSN: 0018-9200
DOI: 10.1109/4.1027

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