Measurement of the lattice constant of Si-Ge heteroepitaxial layers grown on a silicon substrate : Herze Aharoni. Vacuum 28, (12) 571

• Publisher: Elsevier Science
• Year: 1979
• Tongue: English
• Weight: 124 KB
• Volume: 19
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(79)90288-9