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Measurement of the ionization rates in diffused silicon p-n junctions : R. van Overstraeten and H. de Man, Solid-St. Electron. 13 (1970), p. 583

Publisher: Elsevier Science
Year: 1970
Tongue: English
Weight: 99 KB
Volume: 9
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(70)90205-2

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