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Measurement of the energy band discontinuities in a-SiC p-i-n junctions by internal photoemission

✍ Scribed by Wei Guang-Pu; Dusit Kruangam; Toshihito Endo; Hiroaki Okamoto; Yoshihiro Hamakawa


Book ID
115987163
Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
169 KB
Volume
114
Category
Article
ISSN
0022-3093

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