Recent publications have demonstrated and discussed the use of Fourier analysis to characterize the faradaic admittance frequency response profile using impulse 1-3, random white noise 4 and pseudorandom white noise 4 test signals. In each ease it was shown that frequency domain data can be a~uired
β¦ LIBER β¦
Measurement of the electroconductivity of nonmagnetic metallic nanofilms at ultra-high frequencies
β Scribed by A. I. Mekhannikov
- Publisher
- Springer US
- Year
- 2010
- Tongue
- English
- Weight
- 143 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0543-1972
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