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Measurement of the diffusion-length of carriers and excitons in CdS using laser-induced transient gratings

✍ Scribed by C. Weber; U. Becker; R. Renner; C. Klingshirn


Book ID
112514385
Publisher
Springer
Year
1988
Tongue
English
Weight
515 KB
Volume
72
Category
Article
ISSN
1434-6036

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## Abstract We report on a contactless, all‐optical study of carrier diffusion and recombination kinetics in single‐crystalline diamond layers using the light‐induced transient grating (LITG) technique. Decay times of transient diffraction grating yielded carrier lifetime of __Ο„__~R~β€‰β‰ˆβ€‰3 ns and bip