Measurement of the concentration of 2D electrons in δ-doped InGaAs/GaAs pseudomorphic transistor structures using the photoluminescence spectroscopy

✍ Scribed by Yaremenko, N. G.; Galiev, G. B.; Vasil’evskii, I. S.; Klimov, E. A.; Karachevtseva, M. V.; Strakhov, V. A.

• Book ID: 120401414
• Publisher: SP MAIK Nauka/Interperiodica
• Year: 2013
• Tongue: English
• Weight: 237 KB
• Volume: 58
• Category: Article
• ISSN: 1064-2269
• DOI: 10.1134/S1064226913030133