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Measurement of the barrier height ΦB of SiSnO2 heterojunction by the high-frequency capacitance method: A. Kolodziej, T. Pisarkiewicz and T. Piech. Electron. Technol.10, (1) 49 (1977)


Publisher
Elsevier Science
Year
1977
Tongue
English
Weight
125 KB
Volume
16
Category
Article
ISSN
0026-2714

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