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Measurement of the absorption edge of thick transparent substrates using the incoherent reflection model and spectroscopic UV–visible–near IR ellipsometry

✍ Scribed by M. Kildemo; R. Ossikovski; M. Stchakovsky


Book ID
114086290
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
300 KB
Volume
313-314
Category
Article
ISSN
0040-6090

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