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Measurement of the A1Π−X1σ+ electronic transition moment of SiO using a shock tube

✍ Scribed by Chung S. Park; David R. Crosley; Donald J. Eckstrom; Karen R. Heere

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 950 KB
Volume: 49
Category: Article
ISSN: 0022-4073
DOI: 10.1016/0022-4073(93)90099-4

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