𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Measurement of surface relaxation by MeV ion backscattering and channeling

✍ Scribed by J.A. Davies; D.P. Jackson; J.B. Mitchell; P.R. Norton; R.L. Tapping

Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
97 KB
Volume
54
Category
Article
ISSN
0375-9601

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Characterization of epitaxial group II f
Characterization of epitaxial group II fluoride films on (100)-oriented GaAs substrates by ion backscattering and channeling
✍ Dr. R. Flagmeyer; Dr. B. Schumann πŸ“‚ Article πŸ“… 1987 πŸ› John Wiley and Sons 🌐 English βš– 539 KB

Lattice matched (Ca, Sr)F, and related fluoride films grown on (100)GaAs substrates were investigated by Rutherford backscattering/Channeling. This technique allows the characterization of the 30-250 nm thick heteroepitaxial layers with respect to chemical composition, film thickness, interface roug