Measurement of surface recombination velocity of silicon wafers under sunlight condition by novel photoluminescence surface state spectroscopy

✍ Scribed by Toshiya Saitoh; Youichiro Nishimoto; Hideki Hasegawa

• Book ID: 103966026
• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 281 KB
• Volume: 34
• Category: Article
• ISSN: 0927-0248
• DOI: 10.1016/0927-0248(94)90036-1