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Measurement of surface orientation in uniaxial poly(ethylene terephthalate) films using polarised specular reflectance Fourier transform infrared microscopy

✍ Scribed by Neil J. Everall; John M. Chalmers; Andrea Local; Simon Allen


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
528 KB
Volume
10
Category
Article
ISSN
0924-2031

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