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Measurement of surface microrelief for a set of images with a different position of the focus

✍ Scribed by A. A. Zakharchenko; A. I. Chulichkov

Book ID
106465125
Publisher
Springer US
Year
2007
Tongue
English
Weight
452 KB
Volume
50
Category
Article
ISSN
0543-1972

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## Abstract Microscopy imaging can not achieve both high resolution and wide image space simultaneously. Autofocusing is of fundamental importance to automated micromanipulation. This article proposes a new wavelet‐based focus measure, which is defined as a ratio of high frequency coefficients and