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Measurement of single electron lifetimes in a multijunction trap

✍ Scribed by Dresselhaus, P. D.; Ji, L.; Han, Siyuan; Lukens, J. E.; Likharev, K. K.


Book ID
126021969
Publisher
The American Physical Society
Year
1994
Tongue
English
Weight
261 KB
Volume
72
Category
Article
ISSN
0031-9007

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