✦ LIBER ✦
Measurement of silicon strength as affected by wafer back processing : George Hawkins, Howard Berg, Mali Mahalingam, Gary Lewsis and Lynn Lofgran. Annual Proceedings of the Reliability Physics Symposium, San Diego, U.S.A., p. 216 (1987)
- Publisher
- Elsevier Science
- Year
- 1988
- Tongue
- English
- Weight
- 127 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0026-2714
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