✦ LIBER ✦
Measurement of shallow dopant impurity profile in silicon using anodic sectioning and Lange method of Hall measurement
✍ Scribed by P.K. Basu; B.C. Chakravarty; S.N. Singh; P. Dutta; R. Kesavan
- Book ID
- 103966258
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 288 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0927-0248
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