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Measurement of resistance and spin-memory loss (spin relaxation) at interfaces using sputtered current perpendicular-to-plane exchange-biased spin valves

✍ Scribed by Park, Wanjun; Baxter, David V.; Steenwyk, S.; Moraru, I.; Pratt, W. P.; Bass, J.


Book ID
125811018
Publisher
The American Physical Society
Year
2000
Tongue
English
Weight
126 KB
Volume
62
Category
Article
ISSN
1098-0121

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