Measurement of piezoelectric field and tunneling times in strongly biased InGaN/GaN quantum wells

✍ Scribed by Jho, Y. D.; Yahng, J. S.; Oh, E.; Kim, D. S.

• Book ID: 119940869
• Publisher: American Institute of Physics
• Year: 2001
• Tongue: English
• Weight: 362 KB
• Volume: 79
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.1396315