Measurement of penetration depth λ(T) in YBa2Cu3O7−δ thin film

✍ Scribed by JuYoung Lee; Thomas R. Lemberger; S. Foltyn; X.D. Wu

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 143 KB
• Volume: 194-196
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/0921-4526(94)91293-9

✦ Synopsis

We present the magnetic penetration depth X(/) in two laser ablated YBa~Cu307_ n thin films, determined by the two-coil method. The slope of 1/Xz(/) near T~, the only exactly measurable quantity, extrapolates to 930A at T=0, which compares well with 830~, in the high quality single crystal recently reported by Hardy et al., and which exhibited a linear Tdependence at low T. For T < 30K, we find X(/)/X(0)-I = a(T/T~) 2 where a=0.5.