✦ LIBER ✦
Measurement of oxide film growth on Mg and Al surfaces over extended periods using XPS
✍ Scribed by C. Chen; S.J. Splinter; T. Do; N.S. McIntyre
- Book ID
- 117217406
- Publisher
- Elsevier Science
- Year
- 1997
- Tongue
- English
- Weight
- 424 KB
- Volume
- 382
- Category
- Article
- ISSN
- 0039-6028
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