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Measurement of object height in emission electron microscopy

✍ Scribed by F. Schertz; D. Kutnyakhov; S. Schuppler; P. Nagel; S. A. Nepijko; G. Schönhense


Publisher
Springer
Year
2010
Tongue
English
Weight
326 KB
Volume
102
Category
Article
ISSN
1432-0630

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