✦ LIBER ✦
Measurement of minority carrier lifetime in n-type MBE HgCdTe and its dependence on annealing
✍ Scribed by D. D. Edwall; R. E. DeWames; W. V. McLevige; J. G. Pasko; J. M. Arias
- Book ID
- 107457654
- Publisher
- Springer US
- Year
- 1998
- Tongue
- English
- Weight
- 196 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0361-5235
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