Measurement of minority carrier lifetime during gradual degradation of GaAs-Ga1-xAlxAs double- heterostructure lasers

✍ Scribed by Chinone, N.; Ito, R.; Nakada, O.

• Book ID: 119792907
• Publisher: IEEE
• Year: 1974
• Tongue: English
• Weight: 669 KB
• Volume: 10
• Category: Article
• ISSN: 0018-9197
• DOI: 10.1109/jqe.1974.1068083