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Measurement of millimeter-wave reflection coefficients by using a T-junction

โœ Scribed by Takashi Iwasaki; Akio Nagatsuka; Toshio Nemoto

Book ID
112075029
Publisher
John Wiley and Sons
Year
1981
Tongue
English
Weight
529 KB
Volume
64
Category
Article
ISSN
8756-6621

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This article describes an electric-field measurement system that is based on electro-optic sampling (EOS). This system is able to map near-and far-field patterns of millimeter waves radiated from antennas by scanning the electric-field sensor probe. With the bandwidth set to more than 150 GHz, it ca