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Measurement of Local Lattice Parameter in Ion-Implanted Silicon Using HOLZ Lines

✍ Scribed by Uesugi, F. ;Kikuchi, Y. ;Watanabe, K. ;Hashimoto, I.


Publisher
John Wiley and Sons
Year
2000
Tongue
English
Weight
324 KB
Volume
177
Category
Article
ISSN
0031-8965

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