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Measurement of kaonic X-rays from Al, Si, Ni and Cu

✍ Scribed by P.D. Barnes; R.A. Eisenstein; W.C. Lam; J. Miller; R.B. Sutton; M. Eckhause; J.R. Kane; R.E. Welsh; D.A. Jenkins; R.J. Powers; A.R. Kunselman; R.P. Redwine; R.E. Segel

Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 992 KB
Volume: 231
Category: Article
ISSN: 0375-9474
DOI: 10.1016/0375-9474(74)90511-9

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